Microhardness testing providers in the USA? Energy Dispersive X-Ray Spectroscopy (EDS): While in a Scanning Electron Microscope (SEM), samples are exposed to high energy electrons in a vacuum, which generates X-rays through secondary electron transitions. Variations in electron configuration specific to each element generate different energy electrons, and thus different signature energy peaks, indicating which elements are present in the sample. Analysis is performed only on areas which are exposed to the electron beam, facilitating precise control of the analyzed area. This means the composition of very small areas or particles in a sample can be taken. Since EDS is performed in the SEM chamber, a quick and easy interrogation of the surface materials as viewed on the SEM is possible. This can be expanded to include the entire sample, please see our Elemental Mapping page. Additionally, relative amount of the elements present can be calculated, generating composition percentages. Read more details on this site.
As indicated in the FTIR spectral comparison below, the suspect material showed a near perfect match for acetylsalicylic acid. Additionally, there was a small amount of dibasic phosphate present. It was determined that the material was likely acetylsalicylic acid with a phosphate binder – an aspirin. Therefore, from this analysis the suspect material in the bottle was likely a household aspirin tablet, broken apart and separated by the water. In order to confirm the identification, a few aspirin tablets from several common manufacturers were obtained, roughly ground, and soaked to allow for comparison. The optical morphology of the crystals, size range of the particles, association with the phosphate and FTIR spectrum all were consistent with the original suspect material. A report detailing the methods and findings in full narrative form was rendered to the client.
Close examination of any possible defects or voids was undertaken at higher magnification. The voids did not appear to create any structural or conductivity issues. Additionally, the formation and contiguity of intermetallic bonds between the contacts and solder were shown using a combination of EDS line scan elemental spectroscopy and elemental mapping. The SEM image and the EDS map to the left show the intermetallic layer between the copper wire and the tin/lead solder via the mixture of the red copper and the blue tin.
How do I submit a sample or a set of samples? To submit a sample or set of samples, please see the page How to Submit Samples. What if I believe my samples are hazardous? We are not equipped to handle or dispose of every kind of hazardous material. Please call us before sending in any potentially hazardous samples. In cases where we are able to analyze your harzardous samples we may not be able to dispose of them and therefore we will return them to you.
Dust samples were analyzed using polarized light microscopy (PLM) to provide percentages of the particle types present in the samples. MVL was able to determine that there was significant loading of glass fibers in the dust samples with the likely source being contractor’s work in the attic which involved disturbing the fiberglass insulation. The image on the right shows a few distinct glass fibers with a binder material adhered to them, consistent with fiberglass insulation.
MicroVision Laboratories, Inc. has been providing extensive expertise in micro-analytical techniques (FE-SEM, SEM, EDS, XRF, FTIR testing, PLM, X-Ray Imaging, DIC) and sample preparation since 2003. Our cutting edge, high-performance equipment combined with our solutions-focused customer service provide critical solutions for clients hailing from a broad range of industries ranging from medical to semiconductor, and from environmental to textile. Discover even more info on https://microvisionlabs.com/.